CUTTING EDGE PRODUCTS
Deposition System
Etch System
Mini (De) Mux Chip
4 Channel ROSA
Laser End Point Detectors
Optical Monitors
ONE-STOP SERVICES
Engineering
Design & Prototyping
Plasma Source Refurbishment
System Refurbishment
Thin Film Processing
.
INNOVATIVE R&D.
Biased Target Deposition
In-situ Process Monitoring
Dynamic Process Compensation
Ion Beam Deposition
Ion Beam Etch
Direct IBD
Ion-Assisted Evaporation
 

BATCH DEPOSITION SYSTEMS

4Wave's family of batch deposition systems address the needs of researcher in demanding, cross-disciplinary dielectric, metallic, magnetic, superconducting and semiconducting thin-film development. Our customers' can deposit multi-layers on samples up to 100mm using either biased target or conventional ion beam deposition technologies. We offer several options, including low energy ion assist, high energy ion etching, heated stage, magnetic stage and single wafer load lock. The level of automation available ranges from a manual touch screen to a fully automated computer control system.

Applications:

  • Spin Valves / AMR / GMR
  • Magnetic Tunnel Junctions
  • Dielectric Interference Coatings
  • Rugate Filters
  • High-k Materials
  • Shape Memory Alloys
  • Optoelectronic Materials
  • Superconducting Materials


Ion Beam Deposition

Ion Beam Deposition and Etching / Assist Batch System 

 

Features:
  • High energy plasma source (RF or DC)
  • 3 x 4" target carousel
  • 100mm diameter process surface Deposition Uniformity < 3%
  • Etch Uniformity <5%
  • Substrate plasma cleaning, etching, oxidation, nitridation (Gridded or Gridless)
  • Water cooled, tilting, rotating, magnetic, shuttered stage, heating up to  600 C
  • Single wafer load lock stage
  • Cryogenic or Turbo pumping system


Biased Target Deposition

Biased Target Deposition and Etching / Assist Batch System 

[ CLICK HERE FOR PDF BROCHURE ]

Thin Film Deposition and Ion Milling Control Cabinets Features:
  • Low Energy Gridless plasma source 
  • 3 x 4" target carousel
  • Pulse DC target from 1Hz to 75Khz up to -1300V
  • 100mm diameter process surface
  • Deposition Uniformity < 3%
  • Etch uniformity <5% 
  • Substrate plasma cleaning, etching, oxidation, nitridation (Gridded or Gridless)
  • Water cooled, tilting, rotating, magnetic, shuttered stage, heating up to  600 C
  • Single wafer load lock stage
  • Cryogenic or Turbo pumping system

 

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