CUTTING EDGE PRODUCTS
Deposition System
Etch System
Mini (De) Mux Chip
4 Channel ROSA
Laser End Point Detectors
Optical Monitors
ONE-STOP SERVICES
Engineering
Design & Prototyping
Plasma Source Refurbishment
System Refurbishment
Thin Film Processing
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INNOVATIVE R&D
Biased Target Deposition
In-situ Process Monitoring
Dynamic Process Compensation
Ion Beam Deposition
Ion Beam Etch
Direct IBD
Ion-Assisted Evaporation

 

OUR PRODUCTS

To meet your hardware needs, we provide a line of state-of-the-art vacuum systems and assemblies specific to your thin-film processing. 4Wave also offers miniature optical components and compete opto-electrical assemblies.  Our work does not end with installation and integration. We are committed to customer support to assist with problem-solving and ensure the long-term reliability and performance of our products.

Deposition Systems

We provide a variety of custom R&D and production systems for the deposition of  dielectric, metallic, magnetic, alloy, superconducting and semiconducting thin-film films. More...

Etch Systems

The family of ion etching systems addresses the needs of customers seeking a flexible, cost-effective, small footprint, ion-etching/processing workhorse for general-purpose research and small-scale production applications. More...

Mini (De)Mux Chip

4Wave offers a multibounce-cavity, four-channel CWDM (de)mux filter array for 10-gigabit Ethernet and other applications. More...

4 Channel  Receiver Optical Sub Assembly

4Wave has developed a fully integrate Quad Receiver Optical Sub Assembly. This product has been designed specifically for the LX4 10 GBE transceiver. More...

Endpoint Detection

Our dry etch laser end point detectors are specialized interferometers adapted for etching applications. They have a superb modeling capability that predicts the reflection curve from the wafer before the etch. More...

Our optical thickness monitors operate on substrates on rotating workholders, ensuring accurate and repeatable measurements of thin films during deposition. More...

 

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