Product Description
The 4Wave Model IBE14L01-FA system is a flagship product
addressing several significant markets. This system boasts high
performance etching, critical thin film profile milling, glancing
angle milling, etc. It addresses the needs of customers seeking a
flexible, high throughput, cost-effective, Failure Analysis and Yield
Improvement processing. The system is capable of single chip or
multiple chip configuration. This model is already serving the leading
global Semiconductor companies.
Applications:
- Semiconductor Failure Analysis (PFA)
- Yield Improvement
- Anti-Counterfeit and Supply Chain Security
- Semiconductor Chip Quality Assurance
- Process Control and Chip Design Assessment
- Chip Reverse Engineering
- Semi-Conductor
- Data Storage
- MEMS
- Wafer processing services
- Delayering (Failure Analysis)
- Patterned Etch
Features:
- Integrated Secondary Ionization Mass Spectrometer (SIMS)
- Advanced Ion Beam Source
- Custom Ion Optics and Beam Shaping
- Advanced Semiconductor Layer Stop Technology (SLST)
- Automatic Layer Termination Software
- Fully Automatic Sample Transfer With Load Lock